01108nam a22002651a 4500 1/19594 021119s2000 maua b 001 0 eng d 0792379918 20163 DLC GR-PeUP 621.395 BU Bushnell, Michael L. (Michael Lee) 1950- Essentials of electronic testing for digital, menory and mixed-signal VLSI circuits / Michael L. Bushnell, Vishwani D. Agrawal. Boston : Kluwer Academic, 2000. xviii, 690 p. : ill. ; 26 cm. Frontiers in electronic testing ; Includes bibliographical references (p. [631]-670) and index. Integrated circuits Very large scale integration Testing. Digital integrated circuits Testing. Mixed signal circuits Testing. Semiconductor storage devices Testing. Agrawal, Vishwani D., 1943- Frontiers in electronic testing. INST UNIPILB MAIN 20040709 621.395 BU 00140391 00140391 LOAN 0 1 /webopac/covers/01/20163_0792379918.jpg