00824nam a22002175 4500 1/23244 040524s1998 us a 001 0 eng 0792380835 24781 DLC GR-PeUP 621.3815 SAC Sachdev, Manoj. Defect oriented testing for CMOS analog and digital circuits / Manoj Sachdev Boston: Kluwer Academic, 1998 xiv, 308 p. : ill.; 25 cm. Includes bibliographical references and index Metal oxide semiconductors, Complementary Testing. Metal oxide semiconductors, Complementary Defects. Linear integrated circuits Testing. INST UNIPILB MAIN 20040910 621.3815 SAC 00143822 00143822 LOAN 0 1 /webopac/covers/02/24781_0792380835.jpg