00926nam a22002415 4500 1/23254 040524s2003 us a 001 0 eng 140207235X 24791 DLC GR-PeUP 621.39'5 NIC Nicolici, Nicola. Power-constrained testing of VLSI circuits/ Nicolici, Nicola, Al-Hashimi, Bashir Boston: Kluwer Academic, 2003 xi, 178 p. : ill.; 25 cm. Frontiers in electronic testing ; Integrated circuits Very large scale integration Testing. Integrated circuits Very large scale integration Protection. Semiconductors Thermal properties. Al-Hashimi, Bashir. Frontiers in electronic testing ; 22. INST UNIPILB MAIN 20040915 621.39'5 NIC 00143852 00143852 LOAN 0 1 /webopac/covers/02/24791_140207235X.jpg