00904nam a2200241 4500 1/23258 040917s2004 enk b 001 0 eng d 1402077521 24795 DLC GR-PeUP 004.53 HAM Hamdioui, Said. Testing static random access memories : defects, fault models and test patterns / by Said Hamdioui Boston : Kluwer Academic Pub., 2004 221 σ. : πίν. ; 24 εκ. Frontiers in electronic testing ; Περιέχει ευρετήριο Περιέχει βιβλιογραφία Random access memory Testing. RAM (Computer memory) Frontiers in electronic testing. INST UNIPILB MAIN 20040917 004.53 HAM 00143848 00143848 LOAN 0 1 /webopac/covers/02/24795_1402077521.jpg