01087nam a2200265 a 4500 1/38760 091110s2008 enk b 001 0 eng d 9780387747460 (hardcover : alk. paper) 9780387747477 (ebook) 41406 DLC GR-PeUP 620.5 EME Emerging nanotechnologies : test, defect tolerance, and reliability / Mohammad Tehranipoor, editor. New York : Springer, 2008. xii, 405 σ. ; 24 εκ. Frontiers in electronic testing ; v.37. Περιέχει βιβλιογραφία και Electronic circuits. Industrial engineering. Nanotechnology. lectronic testing ; v.37. Tehranipoor, Mohammad. Frontiers in artificial intelligence and applications. INST UNIPILB MAIN 20091110 620.5 EME 00159532 00159532 LOAN 0 1 /webopac/covers/02/41406_9780387747460.jpg (hardcover : alk. paper) /webopac/covers/02/41406_9780387747477.jpg (ebook)