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    <title>Αποτελέσματα για "Digital integrated circuits Testing."</title>
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      <title>Essentials of electronic testing for digital, menory and mixed-signal VLSI circuits /</title>
      <pubDate>Sat, 01 Jan 2000 20:22:25 +0200</pubDate>
      <link>http://okeanos.lib.unipi.gr/Record/1%2F19594</link>
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      <author>Bushnell, Michael L. 1950-</author>
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      <dc:date>2000</dc:date>
      <dc:creator>Bushnell, Michael L. 1950-</dc:creator>
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      <title>Testing of digital systems /</title>
      <pubDate>Wed, 01 Jan 2003 20:22:25 +0200</pubDate>
      <link>http://okeanos.lib.unipi.gr/Record/1%2F23046</link>
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      <author>Jha, Niraj K.</author>
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      <dc:date>2003</dc:date>
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      <title>Testability concepts for digital ICs : The Makro Test Approach /</title>
      <pubDate>Sun, 01 Jan 1995 20:22:25 +0200</pubDate>
      <link>http://okeanos.lib.unipi.gr/Record/1%2F23232</link>
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      <author>Beenker, F.P.M.</author>
      <dc:format>Book</dc:format>
      <dc:date>1995</dc:date>
      <dc:creator>Beenker, F.P.M.</dc:creator>
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      <title>Introduction to IDDQ testing /</title>
      <pubDate>Wed, 01 Jan 1997 20:22:25 +0200</pubDate>
      <link>http://okeanos.lib.unipi.gr/Record/1%2F23242</link>
      <guid>http://okeanos.lib.unipi.gr/Record/1%2F23242</guid>
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      <dc:date>1997</dc:date>
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      <title>Design for AT speed test diagnosis and measurment/</title>
      <pubDate>Sat, 01 Jan 2000 20:22:25 +0200</pubDate>
      <link>http://okeanos.lib.unipi.gr/Record/1%2F23248</link>
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