<?xml version="1.0" encoding="UTF-8"?>
<rss version="2.0" xmlns:opensearch="http://a9.com/-/spec/opensearch/1.1/" xmlns:atom="http://www.w3.org/2005/Atom" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:slash="http://purl.org/rss/1.0/modules/slash/">
  <channel>
    <title>Αποτελέσματα για "Electronic circuits Testing."</title>
    <description>Εμφανίζονται 1-5 από 5</description>
    <generator>Zend_Feed_Writer 2 (http://framework.zend.com)</generator>
    <link>http://okeanos.lib.unipi.gr/Search/Results?lookfor=%22Electronic+circuits+Testing.%22&amp;type=Subject&amp;sort=last_indexed+desc&amp;limit=50</link>
    <opensearch:totalResults>5</opensearch:totalResults>
    <opensearch:startIndex>0</opensearch:startIndex>
    <opensearch:itemsPerPage>50</opensearch:itemsPerPage>
    <opensearch:Query role="request" searchTerms="&quot;Electronic circuits Testing.&quot;" startIndex="0"/>
    <atom:link rel="first" type="application/rss+xml" href="http://okeanos.lib.unipi.gr/Search/Results?lookfor=%22Electronic+circuits+Testing.%22&amp;type=Subject&amp;sort=last_indexed+desc&amp;limit=50&amp;view=rss"/>
    <atom:link rel="last" type="application/rss+xml" href="http://okeanos.lib.unipi.gr/Search/Results?lookfor=%22Electronic+circuits+Testing.%22&amp;type=Subject&amp;sort=last_indexed+desc&amp;limit=50&amp;view=rss"/>
    <atom:link rel="self" type="application/rss+xml" href="http://okeanos.lib.unipi.gr/Search/Results?lookfor=%22Electronic+circuits+Testing.%22&amp;type=Subject&amp;sort=last_indexed+desc&amp;limit=50&amp;view=rss"/>
    <item>
      <title>Proceedings : 14th IEEE International On-Line Testing Symposium : Rhodes, Greece, July 6-9, 2008 /</title>
      <pubDate>Tue, 01 Jan 2008 10:41:59 +0200</pubDate>
      <link>http://okeanos.lib.unipi.gr/Record/1%2F36210</link>
      <guid>http://okeanos.lib.unipi.gr/Record/1%2F36210</guid>
      <dc:format>Book</dc:format>
      <dc:date>2008</dc:date>
      <slash:comments>0</slash:comments>
    </item>
    <item>
      <title>Proceedings, IOLTS 2007 13th IEEE International On-Line Testing Symposium : Heraklion, Crete, Greece, 8-11 July, 2007.</title>
      <pubDate>Mon, 01 Jan 2007 10:41:59 +0200</pubDate>
      <link>http://okeanos.lib.unipi.gr/Record/1%2F33171</link>
      <guid>http://okeanos.lib.unipi.gr/Record/1%2F33171</guid>
      <dc:format>Book</dc:format>
      <dc:date>2007</dc:date>
      <slash:comments>0</slash:comments>
    </item>
    <item>
      <title>On-line testing for VLSI/</title>
      <pubDate>Thu, 01 Jan 1998 10:41:59 +0200</pubDate>
      <link>http://okeanos.lib.unipi.gr/Record/1%2F23243</link>
      <guid>http://okeanos.lib.unipi.gr/Record/1%2F23243</guid>
      <dc:format>Book</dc:format>
      <dc:date>1998</dc:date>
      <slash:comments>0</slash:comments>
    </item>
    <item>
      <title>Embedded Processor-Based Self-Test /</title>
      <pubDate>Thu, 01 Jan 2004 10:41:59 +0200</pubDate>
      <link>http://okeanos.lib.unipi.gr/Record/1%2F24292</link>
      <guid>http://okeanos.lib.unipi.gr/Record/1%2F24292</guid>
      <author>Γκιζόπουλος, Δημήτρης.</author>
      <dc:format>Book</dc:format>
      <dc:date>2004</dc:date>
      <dc:creator>Γκιζόπουλος, Δημήτρης.</dc:creator>
      <slash:comments>0</slash:comments>
    </item>
    <item>
      <title>Advanced formal verification /</title>
      <pubDate>Thu, 01 Jan 2004 10:41:59 +0200</pubDate>
      <link>http://okeanos.lib.unipi.gr/Record/1%2F31256</link>
      <guid>http://okeanos.lib.unipi.gr/Record/1%2F31256</guid>
      <dc:format>Book</dc:format>
      <dc:date>2004</dc:date>
      <slash:comments>0</slash:comments>
    </item>
  </channel>
</rss>
