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    <title>Αποτελέσματα για "Frontiers in electronic testing."</title>
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      <title>Essentials of electronic testing for digital, menory and mixed-signal VLSI circuits /</title>
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      <author>Bushnell, Michael L. 1950-</author>
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      <title>Testability concepts for digital ICs : The Makro Test Approach /</title>
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      <title>Introduction to IDDQ testing /</title>
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      <title>Boundary scan interconnect diagnosis /</title>
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      <title>Data mining and diagnosing IC fails /</title>
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      <title>Emerging nanotechnologies : test, defect tolerance, and reliability /</title>
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