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|a 0792382951
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|l 24784
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|a DLC
|b GR-PeUP
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|a 621.39'5 KRS
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| 100 |
1 |
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|a Krstic, Angela
|d 1965-
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| 245 |
1 |
0 |
|a Delay fault testing for VLSI circuits/
|c Angela Krstic,Kwang-Ting (Tim) Cheng
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| 260 |
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|a Boston :
|b Kluwer Academic Publishers, ;
|c 1998
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| 300 |
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|a xii, 191 σ. :
|b ill. ;
|c 24 εκ.
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| 504 |
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|a Includes bibliographical references and index.
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| 650 |
|
4 |
|a Integrated circuits
|x Very large scale integration
|x Testing.
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| 650 |
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4 |
|a Delay faults (Semiconductors)
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| 700 |
1 |
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|a Cheng, Kwang-Ting
|d 1961-
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| 852 |
|
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|a INST
|b UNIPILB
|c MAIN
|e 20040910
|h 621.39'5 KRS
|p 00143819
|q 00143819
|t LOAN
|y 0
|4 1
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| 856 |
4 |
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|d /webopac/covers/02/24784_0792382951.jpg
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