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061127s2005 enka b 001 0 eng d |
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|a 1402032072
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|a 0387256245
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|l 33946
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|a DLC
|b GR-PeUP
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|a 621.3815 LAR
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100 |
1 |
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|a Larsson, Erik,
|d 1966-
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1 |
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|a Introduction to advanced system-on-chip test design and optimization /
|c by Erik Larsson.
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260 |
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|a Dordrecht :
|b Springer,
|c c2005.
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300 |
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|a xv, 388 σ. :
|b εικ. ;
|c 25 εκ.
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490 |
1 |
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|a Frontiers in electronic testing ;
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500 |
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|a Περιέχει ευρετήριο.
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504 |
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|a Περιέχει βιβλιογραφία: σ. 353-382.
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650 |
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4 |
|a Systems on a chip
|x Testing.
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650 |
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4 |
|a Integrated circuits
|x Design and construction.
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830 |
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|a Frontiers in electronic testing.
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852 |
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|a INST
|b UNIPILB
|c MAIN
|e 20061127
|h 621.3815 LAR
|p 00151444
|q 00151444
|t LOAN
|y 0
|4 1
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|d /webopac/covers/02/33946_1402032072.jpg
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|d /webopac/covers/02/33946_0387256245.jpg
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