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061127s2005 nyua bi 001 0 eng |
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|a 0387249931
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| 035 |
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|l 33959
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| 040 |
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|a DLC
|b GR-PeUP
|
| 082 |
0 |
0 |
|a 621.3815'48 HUI
|
| 100 |
1 |
|
|a Huisman, Leendert M.
|
| 245 |
1 |
0 |
|a Data mining and diagnosing IC fails /
|c Leendert M. Huisman.
|
| 260 |
|
|
|a New York :
|b Springer,
|c 2005.
|
| 300 |
|
|
|a xiv, 270 σ. :
|b εικ. ;
|c 24 εκ.
|
| 490 |
1 |
|
|a Frontiers in electronic testing ;
|
| 504 |
|
|
|a Περιέχει βιβλιογραφία και ευρετήριο
|
| 650 |
|
4 |
|a Integrated circuits
|x Testing
|x Statistical methods.
|
| 650 |
|
4 |
|a Semiconductors
|x Failures.
|
| 650 |
|
4 |
|a Data mining.
|
| 830 |
|
|
|a Frontiers in electronic testing.
|
| 852 |
|
|
|a INST
|b UNIPILB
|c MAIN
|e 20061127
|h 621.3815'48 HUI
|p 00151448
|q 00151448
|t LOAN
|y 0
|4 1
|
| 856 |
4 |
|
|d /webopac/covers/02/33959_0387249931.jpg
|
