|
|
|
|
| LEADER |
01108nam a22002651a 4500 |
| 001 |
1/19594 |
| 008 |
021119s2000 maua b 001 0 eng d |
| 020 |
|
|
|a 0792379918
|
| 035 |
|
|
|l 20163
|
| 040 |
|
|
|a DLC
|b GR-PeUP
|
| 082 |
0 |
0 |
|a 621.395 BU
|
| 100 |
1 |
|
|a Bushnell, Michael L.
|q (Michael Lee)
|d 1950-
|
| 245 |
1 |
0 |
|a Essentials of electronic testing for digital, menory and mixed-signal VLSI circuits /
|c Michael L. Bushnell, Vishwani D. Agrawal.
|
| 260 |
|
|
|a Boston :
|b Kluwer Academic,
|c 2000.
|
| 300 |
|
|
|a xviii, 690 p. :
|b ill. ;
|c 26 cm.
|
| 490 |
1 |
|
|a Frontiers in electronic testing ;
|
| 504 |
|
|
|a Includes bibliographical references (p. [631]-670) and index.
|
| 650 |
|
4 |
|a Integrated circuits
|x Very large scale integration
|x Testing.
|
| 650 |
|
4 |
|a Digital integrated circuits
|x Testing.
|
| 650 |
|
4 |
|a Mixed signal circuits
|x Testing.
|
| 650 |
|
4 |
|a Semiconductor storage devices
|x Testing.
|
| 700 |
1 |
|
|a Agrawal, Vishwani D.,
|d 1943-
|
| 830 |
|
|
|a Frontiers in electronic testing.
|
| 852 |
|
|
|a INST
|b UNIPILB
|c MAIN
|e 20040709
|h 621.395 BU
|p 00140391
|q 00140391
|t LOAN
|y 0
|4 1
|
| 856 |
4 |
|
|d /webopac/covers/01/20163_0792379918.jpg
|
