Power-constrained testing of VLSI circuits/
| Κύριος συγγραφέας: | Nicolici, Nicola. |
|---|---|
| Άλλοι συγγραφείς: | Al-Hashimi, Bashir. |
| Μορφή: | Βιβλίο |
| Γλώσσα: | English |
| Στοιχεία έκδοσης: |
Boston:
Kluwer Academic,
2003
|
| Σειρά: |
Frontiers in electronic testing ;
22. |
| Ταξινομικός αριθμός: |
621.39'5 NIC |
| Θέματα: | |
| Ετικέτες: |
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| 100 | 1 | |a Nicolici, Nicola. | |
| 245 | 1 | 0 | |a Power-constrained testing of VLSI circuits/ |c Nicolici, Nicola, Al-Hashimi, Bashir |
| 260 | |a Boston: |b Kluwer Academic, |c 2003 | ||
| 300 | |a xi, 178 p. : |b ill.; |c 25 cm. | ||
| 490 | 1 | |a Frontiers in electronic testing ; | |
| 650 | 4 | |a Integrated circuits |x Very large scale integration |x Testing. | |
| 650 | 4 | |a Integrated circuits |x Very large scale integration |x Protection. | |
| 650 | 4 | |a Semiconductors |x Thermal properties. | |
| 700 | 1 | |a Al-Hashimi, Bashir. | |
| 830 | 0 | |a Frontiers in electronic testing ; |v 22. | |
| 852 | |a INST |b UNIPILB |c MAIN |e 20040915 |h 621.39'5 NIC |p 00143852 |q 00143852 |t LOAN |y 0 |4 1 | ||
| 856 | 4 | |d /webopac/covers/02/24791_140207235X.jpg | |