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091110s2008 enk b 001 0 eng d |
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|a 9780387747460 (hardcover : alk. paper)
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| 020 |
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|a 9780387747477 (ebook)
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|l 41406
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|a DLC
|c GR-PeUP
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|a 620.5 EME
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| 245 |
0 |
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|a Emerging nanotechnologies :
|b test, defect tolerance, and reliability /
|c Mohammad Tehranipoor, editor.
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| 260 |
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|a New York :
|b Springer,
|c 2008.
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| 300 |
|
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|a xii, 405 σ. ;
|c 24 εκ.
|
| 490 |
0 |
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|a Frontiers in electronic testing ;
|v v.37.
|
| 504 |
|
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|a Περιέχει βιβλιογραφία και Electronic circuits.
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| 650 |
|
4 |
|a Industrial engineering.
|
| 650 |
|
4 |
|a Nanotechnology.
|
| 650 |
|
4 |
|a lectronic testing ;
|v v.37.
|
| 700 |
1 |
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|a Tehranipoor, Mohammad.
|
| 830 |
|
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|a Frontiers in artificial intelligence and applications.
|
| 852 |
|
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|a INST
|b UNIPILB
|c MAIN
|e 20091110
|h 620.5 EME
|p 00159532
|q 00159532
|t LOAN
|y 0
|4 1
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| 856 |
4 |
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|d /webopac/covers/02/41406_9780387747460.jpg
|z (hardcover : alk. paper)
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| 856 |
4 |
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|d /webopac/covers/02/41406_9780387747477.jpg
|z (ebook)
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