Encyclopedia of materials characterization surfaces, interfaces, thin films /
Encyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials scie...
Άλλοι συγγραφείς: | Brundle, C. R., Evans, Charles A., Wilson, Shaun. |
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Μορφή: | Ηλεκτρονική πηγή |
Γλώσσα: | English |
Στοιχεία έκδοσης: |
Boston : Greenwich, CT :
Butterworth-Heinemann ;
c1992.
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Σειρά: |
Materials characterization series.
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Θέματα: | |
Διαθέσιμο Online: |
http://www.sciencedirect.com/science/book/9780080523606 |
Ετικέτες: |
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Περίληψη: |
Encyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the Series. It describes widely-ranging techniques in a jargon-free manner and includes summary pages for each technique to supply a quick survey of its capabilities. |
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Φυσική περιγραφή: |
1 online resource (xix, 751 p.) : ill. |
Βιβλιογραφία: |
Includes bibliographical references and index. |
ISBN: |
1591245028 (electronic bk.) 9781591245025 (electronic bk.) 9780080523606 (electronic bk.) 0080523609 (electronic bk.) |