Encyclopedia of materials characterization surfaces, interfaces, thin films /
Encyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials scie...
| Άλλοι συγγραφείς: | Brundle, C. R., Evans, Charles A., Wilson, Shaun. |
|---|---|
| Μορφή: | Ηλεκτρονική πηγή |
| Γλώσσα: | English |
| Στοιχεία έκδοσης: |
Boston : Greenwich, CT :
Butterworth-Heinemann ;
c1992.
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| Σειρά: |
Materials characterization series.
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| Θέματα: | |
| Διαθέσιμο Online: |
http://www.sciencedirect.com/science/book/9780080523606 |
| Ετικέτες: |
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Πίνακας περιεχομένων:
- Introduction and summaries
- Imaging techniques (Microscopy)
- Electron beam instruments
- Structure determination by diffraction and scattering
- Electron emission spectroscopies
- X-ray emission techniques
- Visible/UV emission, reflection, and absorption
- Vibrational spectroscopies and NMR
- Ion scattering techniques
- Mass and optical spectroscopies
- Neutron and nuclear techniques
- Physical and magnetic properties.