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|a 0792380835
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| 035 |
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|l 24781
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| 040 |
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|a DLC
|b GR-PeUP
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| 082 |
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|a 621.3815 SAC
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| 100 |
1 |
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|a Sachdev, Manoj.
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| 245 |
1 |
0 |
|a Defect oriented testing for CMOS analog and digital circuits /
|c Manoj Sachdev
|
| 260 |
|
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|a Boston:
|b Kluwer Academic,
|c 1998
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| 300 |
|
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|a xiv, 308 p. :
|b ill.;
|c 25 cm.
|
| 504 |
|
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|a Includes bibliographical references and index
|
| 650 |
|
4 |
|a Metal oxide semiconductors, Complementary
|x Testing.
|
| 650 |
|
4 |
|a Metal oxide semiconductors, Complementary
|x Defects.
|
| 650 |
|
4 |
|a Linear integrated circuits
|x Testing.
|
| 852 |
|
|
|a INST
|b UNIPILB
|c MAIN
|e 20040910
|h 621.3815 SAC
|p 00143822
|q 00143822
|t LOAN
|y 0
|4 1
|
| 856 |
4 |
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|d /webopac/covers/02/24781_0792380835.jpg
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